Thin Film Measurement Filmetrics

Manufacture: Filmetrics F20-UV

Capabilities

• VIS (190–1100 nm) version
• Thickness range: 1 nm – 40 µm
• SS-3 sample stage with fiber optic cable
• Flattening filter (for highly-reflective substrates)

• Thin-Film Measurement System using spectral reflectance detection method
• VIS (190–1100 nm) version
• Thickness range: 1 nm – 40 µm
• SS-3 sample stage with fiber optic cable 
• Integrated spectrometer/light source unit
• Flattening filter (for highly-reflective substrates)